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Thermomigration-induced magnetic degradation of current perpendicular to the plane giant magnetoresistance spin-valve read sensors operating at high current density
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10.1063/1.3260250
/content/aip/journal/jap/106/11/10.1063/1.3260250
http://aip.metastore.ingenta.com/content/aip/journal/jap/106/11/10.1063/1.3260250

Figures

Image of FIG. 1.
FIG. 1.

Temperature distribution profile in the CPP EBGMR SV multilayers under current densities varying from to (device size: ). Inset shows a schematic illustration of the CPP EBGMR SV read sensor (cross section view).

Image of FIG. 2.
FIG. 2.

Thermal stress profile of CPP EBGMR SV multilayers (device size: ).

Image of FIG. 3.
FIG. 3.

(a) The dependence of operating current density and (b) the dependence of device size on the Mn atomic flux into the pinned CoFe in the CPP EBGMR SV read sensor under electrical stressing.

Image of FIG. 4.
FIG. 4.

(a) The dependence of operating current density (device size: ) and (b) the dependence of device size (applied current density: ) on the magnetostrictive anisotropy field generated in the pinned CoFe layer in the CPP EBGMR SV read sensor under electrical stressing.

Image of FIG. 5.
FIG. 5.

Temperature distribution profile of CPP EBGMR SV multilayers with different device sizes electrically stressed at the fixed current density of .

Tables

Generic image for table
Table I.

Material parameters used for the numerical calculation.

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/content/aip/journal/jap/106/11/10.1063/1.3260250
2009-12-02
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Thermomigration-induced magnetic degradation of current perpendicular to the plane giant magnetoresistance spin-valve read sensors operating at high current density
http://aip.metastore.ingenta.com/content/aip/journal/jap/106/11/10.1063/1.3260250
10.1063/1.3260250
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