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A simplified approach to estimating total trap contributions in negative bias temperature instability
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10.1063/1.3160330
/content/aip/journal/jap/106/2/10.1063/1.3160330
http://aip.metastore.ingenta.com/content/aip/journal/jap/106/2/10.1063/1.3160330
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Relaxation of the threshold voltage shift in -channel MOSFETs subjected to PBTI (Ref. 3). A pulse delay was applied before measurement following a bias stress step. The initial value was .

Image of FIG. 2.
FIG. 2.

Variation in the square root of the source-drain current as a function of the gate to source voltage in a -channel MOSFET. The drain-source voltage, , was −0.9 V. The straight line is a guide to the eyes to show expected behavior in the absence of mobility variation due to the vertical electric field.

Image of FIG. 3.
FIG. 3.

(o) Variation of the threshold voltage shift as a function of bias stress time at 428 K in a -channel MOSFET. The data were obtained by analyzing curves obtained following the sequence bias stress-measure -bias stress……The overall time required to turn off the bias and make the measurement was 3.5–5 s.

Image of FIG. 4.
FIG. 4.

(○) Variation in the source-drain current at as measured following the bias stress-measurement sequence at 428 K outlined in Fig. 3. (△) Variation in in the continuous measurement mode .

Image of FIG. 5.
FIG. 5.

(○) Variation in the threshold voltage shift as a function of bias stress time at 428 K in a -channel MOSFET. The data were obtained by analyzing curves obtained following the sequence bias stress-measure -bias stress….The overall time required to turn off the bias and make the measurement was 3.5–5 s. (△) Approximate variation in the threshold voltage as a function of bias stress time determined from continuous measurement at , .

Image of FIG. 6.
FIG. 6.

Threshold voltage shifts resulting from NBTI as determined from continuous bias data. (△) 368, (◻) 398, and (○) 428 K.

Image of FIG. 7.
FIG. 7.

vs plotted using values from fits to the data shown in Fig. 5, assuming .

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/content/aip/journal/jap/106/2/10.1063/1.3160330
2009-07-23
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: A simplified approach to estimating total trap contributions in negative bias temperature instability
http://aip.metastore.ingenta.com/content/aip/journal/jap/106/2/10.1063/1.3160330
10.1063/1.3160330
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