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Nanodesign of superhydrophobic surfaces
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10.1063/1.3176484
/content/aip/journal/jap/106/2/10.1063/1.3176484
http://aip.metastore.ingenta.com/content/aip/journal/jap/106/2/10.1063/1.3176484

Figures

Image of FIG. 1.
FIG. 1.

Static contact angle (gray full circles) and contact angle hysteresis (black full circles) vs the etching time . The insets show the photographs of water drops with a radius of on flat and water repellent surfaces.

Image of FIG. 2.
FIG. 2.

AFM micrographs [top (a) and three-dimensional view (b)] and surface profile (c) of silanized film preirradiated with and then etched for . The parameters and corresponding respectively to the average distance between two holes and to the thickness of the wall between these structures are also indicated in the figure.

Image of FIG. 3.
FIG. 3.

Static contact angle as a function of the surface aspect ratio . The dashed lines are drawn only to guide the eye.

Image of FIG. 4.
FIG. 4.

Surface roughness power spectra for silanized film (a) and for two samples etched for (gray) and (black), respectively (b). is the Hurst exponent related to the fractal dimension by .

Image of FIG. 5.
FIG. 5.

Height distribution for silanized film (a) and for two samples etched for (b) and (c), respectively. The parameters and correspond respectively to the average height and to the straggling extracted from the Gaussian distributions used to fit the experimental curves. The height distributions were measured on a scanned zone of .

Image of FIG. 6.
FIG. 6.

Cosine of the measured contact angle as a function of both and .

Tables

Generic image for table
Table I.

Etching time , experimental hole diameter , calculated depth of hole structures , measured static , advancing and receding contact angles, lineic fraction of the solid surface in contact with the liquid determined from AFM images, and Wenzel contact angle . The measured contact angles are given with an accuracy of 3°.

Generic image for table
Table II.

Etching time , fractal dimension determined by the PSD method, upper and lower limit lengths of the fractal structure, fractal roughness value , rms-roughness value measured on a scanned zone of , and threshold static contact angle determined from Eq. (4).

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/content/aip/journal/jap/106/2/10.1063/1.3176484
2009-07-21
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Nanodesign of superhydrophobic surfaces
http://aip.metastore.ingenta.com/content/aip/journal/jap/106/2/10.1063/1.3176484
10.1063/1.3176484
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