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Magnetic coupling at interface of ultrathin Co film and antiferromagnetic film
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10.1063/1.3182802
/content/aip/journal/jap/106/3/10.1063/1.3182802
http://aip.metastore.ingenta.com/content/aip/journal/jap/106/3/10.1063/1.3182802
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) azimuth RHEED patterns and corresponding key diagram of Cr(110) thin film on Au(111) base layer. (b) azimuth and (c) azimuth RHEED patterns and corresponding key diagrams of film. Open and closed circles in key diagram represent different sets of diffraction from the twin domains.

Image of FIG. 2.
FIG. 2.

In-plane XRD profiles of (a) , (b) Au(111), and (c) Si(111) substrates, respectively. The diffraction conditions were set to the Bragg conditions for (a) , (b) Au(200), and (c) Si(400), respectively.

Image of FIG. 3.
FIG. 3.

Schematic of the epitaxial relationship of and the Au(111) surface. The corresponding lattice misfit is 0.8%, assuming the bulk lattice parameters.

Image of FIG. 4.
FIG. 4.

RHEED patterns of ultrathin Co films. Co thickness is [(a) and (b)] 2.3 nm and [(c) and (d)] 1.0 nm. Electron incidence is [(a) and (c)] and [(b) and (d)] . The white arrows in (b) and (d) represent the diffraction position from .

Image of FIG. 5.
FIG. 5.

Temperature dependence of magnetization of 2.3-nm-thick Co film on . The applied field strength is 50 Oe. The field direction is (a) perpendicular and (b) parallel to the film plane. The closed and open circles represent the results after FC and ZFC, respectively.

Image of FIG. 6.
FIG. 6.

Temperature dependence of TRM of 2.3-nm-thick Co film on . The closed and open circles represent the results for the applied field directions perpendicular and parallel to the film plane, respectively.

Image of FIG. 7.
FIG. 7.

Temperature dependence of magnetization of 1.0-nm-thick Co film on . The applied field strength was 50 Oe. Closed and open circles represent the results for the applied field directions perpendicular and parallel to the film plane, respectively.

Image of FIG. 8.
FIG. 8.

Magnetization curves of 2.3 nm-thick Co film on . The applied field direction is (a) perpendicular and (b) parallel to the film plane. Closed and open circles represent the results after FC and ZFC, respectively. Insets show the entire magnetization curve in the range from −50 to 50 kOe.

Image of FIG. 9.
FIG. 9.

Temperature dependence of (a) exchange bias field and (b) coercivity of ultrathin Co film on . The applied field direction is perpendicular to the film plane, namely, parallel to the Cr spin direction. Triangles and circles represent the values for 2.3-nm-thick and 1.0-nm-thick Co films, respectively.

Image of FIG. 10.
FIG. 10.

Drawing of the effective torque driving the magnetization reversal of antiferromagnetic grains for the ferromagnetic film with (a) continuous and (b) discontinuous structures. The thin arrows represent the magnetization direction of Co grains (film) and the torque from the individual Co grains (film). The thick arrows represent the effective torque acting on individual antiferromagnetic grains. For the continuous ferromagnetic film, the magnetization is uniform, thus the torque on individual antiferromagnetic grains depends on the grain size of antiferromagnet. On the other hand, for the discontinuous ferromagnetic film, the torque becomes nonuniform owing to the reversal field distribution of ferromagnetic grains, thus the torque on individual antiferromagnetic grains decreases effectively (see text).

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/content/aip/journal/jap/106/3/10.1063/1.3182802
2009-08-04
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Magnetic coupling at interface of ultrathin Co film and antiferromagnetic Cr2O3(0001) film
http://aip.metastore.ingenta.com/content/aip/journal/jap/106/3/10.1063/1.3182802
10.1063/1.3182802
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