(a) Normalized 1D-XRD intensity measurements for mesoporous thin films synthesized with Brij76 (cubic), P123 (cubic and hexagonal), and KLE (cubic); (b) 2D-SAXS patterns of a P123 cubic; and (c) a P123 hexagonal mesoporous silica thin film.
SEM picture of (a) a KLE cubic and (b) a P123 hexagonal mesoporous silica thin film. (c) Zoomed out SEM picture of a P123 hexagonal mesoporous silica thin film on top of a silicon substrate.
(a) Schematic and photograph of the metallic heater and contact pads and (b) electrical circuit used for the method (inspired from Ref. 36).
Measured thermal conductivity of high quality thermal oxide dense films as a function of film thickness along with previously reported data (Refs. 53, 54, and 56).
Comparison between the measured cross-plane thermal conductivity of cubic and hexagonal mesoporous silica thin films at room temperature as a function of film thickness along with previously reported data (Refs. 9 and 24).
Comparison of the measured cross-plane thermal conductivity with the previously proposed nine models (Refs. 14, 32, and 52) and previously reported data for templated mesoporous (Refs. 9 and 24) and selected porous (Ref. 2) silica films. The experimental data were best fitted between the PWSM [Eq. (9)] and PWDM [Eq. (10)] models for (Refs. 2, 9, and 24).
Thermal conductivity of the synthesized cubic and hexagonal mesoporous amorphous silica thin films.
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