(a) SEM image of the suspended microdevice. (b) SEM image of the two central membranes of the microdevice with a Bi NW trapped between the two membranes. (c) SEM image showing detail of the NW sample. The arrows indicate metal patterns deposited on the NW.
High resolution TEM analysis of (a) NW3 and (b) NW2. Electron diffraction patterns using a beam spot are shown as insets.
Thermal conductivity of the Bi NW cores alone. Bulk values perpendicular ( plane) and parallel ( axis) to the trigonal direction are taken from Ref. 1. Lines are calculation results discussed in the text.
Calculated thermal conductivity of bulk Bi perpendicular to the trigonal axis as well as the individual contributions of phonons, electrons, holes, and bipolar diffusion. Symbols are experimental values taken from Ref. 1.
Comparison of the measured thermal conductivity of NW3 with the calculated lattice thermal conductivity for specular (dark solid line) and diffuse (other lines) surface scattering. Unless noted in the figure, the impurity scattering parameter .
Summary of NW samples trapped on the suspended device for thermal and TEM measurement.
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