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Energy band alignment of interface determined by x-ray photoelectron spectroscopy
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10.1063/1.3204028
/content/aip/journal/jap/106/4/10.1063/1.3204028
http://aip.metastore.ingenta.com/content/aip/journal/jap/106/4/10.1063/1.3204028
/content/aip/journal/jap/106/4/10.1063/1.3204028
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/content/aip/journal/jap/106/4/10.1063/1.3204028
2009-08-26
2014-08-31
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Energy band alignment of SiO2/ZnO interface determined by x-ray photoelectron spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/jap/106/4/10.1063/1.3204028
10.1063/1.3204028
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