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Energy band alignment of interface determined by x-ray photoelectron spectroscopy
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10.1063/1.3204028
/content/aip/journal/jap/106/4/10.1063/1.3204028
http://aip.metastore.ingenta.com/content/aip/journal/jap/106/4/10.1063/1.3204028

Figures

Image of FIG. 1.
FIG. 1.

CL spectra for (a) and (e) samples and CL spectra for (c) ZnO and (f) samples. Experimental data points are fitted by Voigt (mixed Lorentzian–Gaussian) line shapes (solid lines, red) after the application of a Shirley background (solid line, blue). Also VB spectra for (b) and (d) ZnO. The peak and VBM positions are summarized in Table I.

Image of FIG. 2.
FIG. 2.

CL spectra for (a) and (b) samples. Experimental data points are fitted by Voigt (mixed Lorentzian–Gaussian) line shapes (solid lines, red) after the application of a Shirley background (solid line, blue). The peak positions are also summarized in Table I.

Image of FIG. 3.
FIG. 3.

Energy band diagram of interface. A type-I heterojunction is formed in the staggered arrangement.

Tables

Generic image for table
Table I.

Binding energies (in electron volt) of the XPS peaks and VBM for the , ZnO, and samples. Energies are referenced to the Fermi level (0 eV). The errors in the peak positions and VBM are ±0.05 and ±0.10 eV, respectively.

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/content/aip/journal/jap/106/4/10.1063/1.3204028
2009-08-26
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Energy band alignment of SiO2/ZnO interface determined by x-ray photoelectron spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/jap/106/4/10.1063/1.3204028
10.1063/1.3204028
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