XRD scans of Pt thin films on with different film thicknesses grown with or without (red dotted line) a predeposition oxygen anneal of the substrate.
XRD scans of (a) the 002 symmetric reflection, (b) the 113 asymmetric reflection in grazing incidence geometry, and (c) the asymmetric reflection in grazing exit geometry of Pt thin films with different thicknesses (13, 39, and 65 nm).
Atomic force microscopy images showing the surface evolution of Pt thin films with thicknesses of (a) 6, (b) 13, (c) 39, and (d) 65 nm. The labels indicate the rms values in nanometers. The scan area is .
(a) Cross-sectional bright-field TEM image showing twins (arrows) in the Pt films. Note the surface tilt associated with the twins. (b) Cross-section HAADF/STEM image of a thick film grown on a 67 nm Pt film on (001) . The Pt film appears very bright because of the atomic number sensitivity of the HAADF imaging mode.
Article metrics loading...
Full text loading...