Evolution of LT (89 K) in situ XRD pattern of a thin film with 200 MeV Ag ion irradiation fluence. In addition to peaks ( to 7) due to YBCO, there are peaks due to the copper sample holder and the substrate.
Evolution of the (005) peak at different 200 MeV Ag ion irradiation fluence at 89 K is shown in a magnified scale.
The exponential decrease in integral intensity of the XRD peak corresponding to the (005) YBCO plane with 200 MeV Ag ion fluence. Dots are the experimental data points and the straight line is the best fit of the experimental data with the expression given by Eq. (1). The inset shows the faster decrease in integral intensity at low fluences.
The variation in the -parameter with irradiation fluence measured in situ at 89 K and at RT. The -parameter shows 0.6% increase on irradiation at the fluence at RT and 1.3% increase at the same fluence at 89 K.
Evolution of the FWHM of different peaks vs ion fluence. The magnified view of the encircled region of the graph is shown as inset.
Williamson–Hall plot for thin film irradiated at different fluences of 200 MeV Ag ions at 89 K. Crystallite size and microstrain at each fluence determined, respectively, from the intercept and slope of the linear fit (solid lines) to the data points are shown in the inset.
Evolution of FWHM of (005) peak with ion fluence. The solid line is the best fit to the experimental data beyond the incubation fluence using Eq. (4), which yields the cross section of for the strained region around amorphous track.
The fraction of the energy deposited by SE in cylindrical radius around ion path is calculated by integrating Eq. (5). The inset shows radial distribution of energy (Dose) around ion path of 200 MeV ions in .
Evolution of the peak centroid, integral intensity, and FWHM with irradiation fluence of the (005) XRD peak. These parameters were obtained by Lorentzian fitting after background subtraction using POWDER X software.
The electronic energy loss , nuclear energy loss , and range of 200 MeV Ag ion in YBCO are given. Also given for comparison are threshold electronic energy loss and film thickness of YBCO thin films.
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