Cross-sectional TEM image showing phase separation in a layer grown on a GaAs substrate. Such a compositional separation results in an XRD double-peak phenomenon, as shown in the inset.
(004) XRD rocking curves of the samples with different multilayers where the constituent layer thicknesses are (a) 0, (b) 10, (c) 20, (d) 40, and (e) 60. The arrows on curves (a)–(c) indicate the appearance of a shoulder peak.
FWHM of (004) diffracted peak as a function of constituent layer thickness. The inset represents the schematic layer structure used in this study.
Comparison of PL spectra for the samples with and without the multilayers. The corresponding FWHM values of the PL emission peaks are shown in the inset.
Representative eight-atom lattices of (a) , (b) , and (c) obtained from density functional theory-based first principles. The atoms are represented by spheres: In (large), Ga (middle), and P (small).
Summary of calculated elastic constants and coefficients for , , and .
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