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Controlling the exchange bias in multiferroic and NiFe bilayers
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10.1063/1.3240338
/content/aip/journal/jap/106/7/10.1063/1.3240338
http://aip.metastore.ingenta.com/content/aip/journal/jap/106/7/10.1063/1.3240338
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

XRD patterns of BFO films grown on (001)STO substrate at various substrate temperatures. The oxygen pressure and the thickness of BFO were fixed at 100 mTorr and 100 nm, respectively.

Image of FIG. 2.
FIG. 2.

(a) AFM images of BFO films deposited at various substrate temperatures. (b) Magnetic hysteresis loops of NiFe on BFO films measured at room temperature.

Image of FIG. 3.
FIG. 3.

(a) AFM images of BFO films deposited at various oxygen pressures. (b) Magnetic hysteresis loops of NiFe on BFO films measured at room temperature.

Image of FIG. 4.
FIG. 4.

Magnetic hysteresis loops of NiFe on BFO films of different thicknesses.

Image of FIG. 5.
FIG. 5.

and as a function of the number of field sweeps for NiFe(5 nm)/BFO(100 nm) bilayers. The obtained data were fitted by an exponential decay function (solid line) of .

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/content/aip/journal/jap/106/7/10.1063/1.3240338
2009-10-13
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Controlling the exchange bias in multiferroic BiFeO3 and NiFe bilayers
http://aip.metastore.ingenta.com/content/aip/journal/jap/106/7/10.1063/1.3240338
10.1063/1.3240338
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