Transport properties of STO/LAO SL. (a) Sheet resistance, (b) sheet carrier density, (c) mobility.
Characterization of the STO/LAO SL. (a) XRD pattern, (b) STEM image with scattering factors defined for the interfaces.
Comparison of the reflectivity spectra between experiment and calculation. (a) Ti on-resonance, (b) Ti off-resonance, (c) models of our SL samples.
Photon-energy dependence of the (002) and (003) peaks near the Ti (a) and O (b) absorption edges. Top and middle panels show intensity maps of (002) and (003) regions, respectively. Here bright parts correspond to high intensities. Bottom panels show the (002) and (003) peak heights together with the XAS spectra.
Peak-position analyses by considering the effects of refraction . (a) (002) at the Ti edge, (b) (003) at the Ti edge, (c) (002) at the O edge, (d) (003) at the O edge.
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