1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Structure and dielectric properties of cubic thin films
Rent:
Rent this article for
USD
10.1063/1.3246807
/content/aip/journal/jap/106/8/10.1063/1.3246807
http://aip.metastore.ingenta.com/content/aip/journal/jap/106/8/10.1063/1.3246807

Figures

Image of FIG. 1.
FIG. 1.

XRD pattern of (a) the -thick film on (111)-oriented substrate deposited at under an oxygen pressure of and (b) the bulk target. [inset: SAD pattern of TEM along the (111) direction in the film].

Image of FIG. 2.
FIG. 2.

HRTEM image of thick film grown on (111)-oriented substrate.

Image of FIG. 3.
FIG. 3.

XRD profiles of the thin film with various film thickness (m: monoclinic phase, c: cubic phase).

Image of FIG. 4.
FIG. 4.

In-plane tensile stress of films as a function of film thickness (inset: plane-view micrograph of TEM for -thick film with arrows marking a strain field).

Image of FIG. 5.
FIG. 5.

Dielectric constant and TCC as a function of the film thickness.

Tables

Generic image for table
Table I.

Compositional analyses of the thick thin film by EPMA

Generic image for table
Table II.

Dielectric properties of monoclinic and cubic ceramics and -thick cubic thin film at .

Loading

Article metrics loading...

/content/aip/journal/jap/106/8/10.1063/1.3246807
2009-10-26
2014-04-21
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Structure and dielectric properties of cubic Bi2(Zn1∕3Ta2∕3)2O7 thin films
http://aip.metastore.ingenta.com/content/aip/journal/jap/106/8/10.1063/1.3246807
10.1063/1.3246807
SEARCH_EXPAND_ITEM