(a) A representative SEM image of high-purity laser SWCNTs used to fabricate SWCNT papers and (b) a digital photograph illustrating the SWCNT paper cloverleaf geometry and stage for temperature-dependent measurements.
(a) The temperature-dependent SWCNT paper conductivity for increasing alpha-particle fluence measured in situ under a vacuum of . The solid lines in the figure are least-squares curve fits of the data using Eq. (1). (b) Variation in [Eq. (1)] temperature curve fitting parameters as a function of alpha-particle fluence.
The NIEL profile of alpha particles incident with SWCNT paper (left), with the corresponding NIEL along a path down the midpoint of the SWCNT paper.
The NIEL and range of C, alpha particles, and protons stopping within a SWCNT paper. The NIEL values correspond to the solid lines and the left axis, while the range values are the dashed lines and correspond to the right axis. The range in units of centimeters can be determined by multiplying the values found in the figure by the density of the SWCNT paper or thin film.
Variation in the SWCNT paper resistivity with displacement damage dose for various irradiating particles including alpha particles from an isotropic source, carbon atoms (Ref. 22), and protons (Ref. 23). Inset: damage coefficient variation with NIEL; the trend line is a power-law fit, , with and .
NIEL and damage coefficients for various particles in SWCNT papers.
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