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The effect of alignment layer thickness on the switching of bistable liquid crystal devices
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10.1063/1.3273482
/content/aip/journal/jap/107/1/10.1063/1.3273482
http://aip.metastore.ingenta.com/content/aip/journal/jap/107/1/10.1063/1.3273482
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Schematic drawing of obliquely evaporated film: (a) regular/thick films and (b) thin films (dashed line shows the evaporation direction).

Image of FIG. 2.
FIG. 2.

Characteristic electro-optical response of the bistable SSFLC cell. Curve on the top is the shape of the applied waveform and curves on the bottom are intensities of light behind crossed polarizers for different amplitudes of the applied waveform.

Image of FIG. 3.
FIG. 3.

Characteristic dependence of threshold voltage on the thickness of alignment layers for different deposition angles: (a) 2°, (b) 3°, (c) 4°, (d) 5°, (e) 6.5°, and (f) 8.5°. Numbers shown next to data points are measured nematic pretilt angles.

Image of FIG. 4.
FIG. 4.

Typical textures of uniform and twisted states of the SSFLC at zero field for different thicknesses of alignment layers: (a) 20 nm, (b) 40 nm, and (c) 180 nm.

Image of FIG. 5.
FIG. 5.

Diagram of structural transitions in SSFLC cell. (a) Thin alignment layer: 20 nm film evaporated at 5°. (b) Intermediate alignment layer: 90 nm film evaporated at 6.5°. (c) Thick alignment layer: 180 nm film evaporated at 6.5°. Dots on the triangular waveform represent transitions between different SSFLC states.

Image of FIG. 6.
FIG. 6.

Micrographs of the SSFLC textures before and after structural switching transitions: (a) surface switching between two uniform states, (b) surface switching between twist and uniform states, (c) chevron switching between two twisted states, and (d) chevron and surface switching between two uniform states.

Image of FIG. 7.
FIG. 7.

Micrographs of the SSFLC textures before and after structural switching transitions: (a) from uniform to twist state and (b) from twist to uniform state.

Image of FIG. 8.
FIG. 8.

Threshold voltage of transitions in the SSFLC cell as a function of thickness. The evaporation angle for the films thinner than 500 Å was 5° and for the other films was 6.5°.

Image of FIG. 9.
FIG. 9.

Plots of switching time vs FLC voltage calculated using Eq. (1) at four values of , with and .

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/content/aip/journal/jap/107/1/10.1063/1.3273482
2010-01-04
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: The effect of SiOx alignment layer thickness on the switching of SmC∗ bistable liquid crystal devices
http://aip.metastore.ingenta.com/content/aip/journal/jap/107/1/10.1063/1.3273482
10.1063/1.3273482
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