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Correlating the structural, chemical, and optical properties at nanometer resolution
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10.1063/1.3275048
/content/aip/journal/jap/107/1/10.1063/1.3275048
http://aip.metastore.ingenta.com/content/aip/journal/jap/107/1/10.1063/1.3275048
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) The sum of all energy-filtered images from 2 to 32 eV shows the structure. (b) Bandgap map of the region marked in (a) with a pixel size of about 7.2 nm, corresponding bandgap values can be read from the legend. (c) Electron energy-loss spectra extracted from the 3D EFTEM stack indicating a bandgap difference of about 0.8 eV.

Image of FIG. 2.
FIG. 2.

(a) Plasmon mapping of the structure, respective plasmon energies can be read from the legend. (b) A line profile acquired from the region marked in (a) showing the plasmon energy together with an Al profile across the interface obtained by the edges from the corresponding element. Dashed lines are a guide to the eye.

Image of FIG. 3.
FIG. 3.

(a) Off-zone-axis HRTEM image across the interface. Only (0002) planes are visible. (b) 2D tetragonal strain map in the growth direction. (c) A line-profile acquired from the region marked in (b) showing the strain gradient at the interface.

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/content/aip/journal/jap/107/1/10.1063/1.3275048
2010-01-04
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Correlating the structural, chemical, and optical properties at nanometer resolution
http://aip.metastore.ingenta.com/content/aip/journal/jap/107/1/10.1063/1.3275048
10.1063/1.3275048
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