Schematic of the periodic layered ferrite-semiconductor composite.
(a) The effective permeability of YIG and the YIG-semiconductor composite. (b) The effective refractive index of the composite in different applied magnetic fields.
Contour plot of the index of the composite as a function of thickness ratio and applied magnetic field.
Electric field distribution of the refracted waves from the prism at 6 GHz. (a) Schematic of the prism in the simulation. The prism is made of 30 unit cells of an YIG-Si multilayer with thickness ratio , and the angle . (b) Field distribution of the refracted wave at 600 Oe, which shows positive refraction. (c) Field distribution of the refracted wave at 1050 Oe, which shows negative refraction. (d) Field distribution of the refracted wave using Rogers Ro3010 instead of the YIG-Si composite.
The frequency shifts for the negative index under some different intensities of applied magnetic fields. The composite is with thickness ratios (a) and (b) .
The loss tangent of the YIG-Si composite and the YIG-mesh composite under different magnetic fields where thickness ratio . (a) Loss tangent of the YIG-mesh composite. (b) Loss tangent of the YIG-Si composite.
Article metrics loading...
Full text loading...