Rutherford backscattering spectrum (open circles) of -16.5% Ag nanocomposite film on Si substrate. Its RUMP simulated spectrum is shown by continuous lines.
(a) UV-visible absorption spectra of thin films of nanocomposite having 4.6%, 16.5%, and 27% Ag along with that of pure fullerene thin film, (b) their Maxwell–Garnett simulated spectra, and (c) shows the SPR band of thin film of -4.6% Ag on glass substrate annealed at different temperatures.
(a) XRD spectra of nanocomposite thin films , , and on quartz substrates. (b) Shows the XRD spectra of film (4.6% Ag) annealed for 30 min at different temperatures. The average particle size determined by Scherrer formula for each annealed film is also written. The curve between particle size and annealing temperature is shown in the inset of figure (b).
[(a)–(c)] Bright field images of nanocomposite thin films having 4.6%, 16.5%, and 27% Ag. SAED patterns for these films are shown in figures (d)–(f).
Bright field images of -4.6% Ag nanocomposite film annealed at for 30 min.
Raman spectra of annealed films of -4.6% Ag nanocomposite at different temperatures along with that of as deposited film showing the transformation of fullerene into a-C.
Curve showing the change in SPR position of -4.6% Ag nanocomposite when annealed at increasing temperatures for 30 min each in neutral atmosphere.
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