XAS and XMCD at the edge for the 20 nm samples capped with (a) 1 nm, (b) 1.5 nm, and (c) 2 nm MgO in addition to a 2 nm Ru cap. Insets: element-specific hysteresis loops obtained by XMCD at the edge measured with the sample along  direction and magnetic field at 30° out of plane.
Same as Fig. 1 but for the edge.
Comparison of the XAS for the 20 nm samples capped with 1, 1.5, and 2 nm MgO in addition to 2 nm Ru.
Fe and Co spin and orbital magnetic moments in Bohr magneton per number of holes as a function of the MgO capping layer thickness (Å).
Angle resolved XPS spectra at (a) the , (b) , (c) , and (d) edges of 20 nm CFAS thin film capped with 1 nm MgO and Ru layer measured at different take-off angles.
The element concentration vs take-off angle obtained from the angle resolved XPS spectra with 10% error bars.
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