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Highly-selective wettability on organic light-emitting-diodes patterns by sequential low-power plasmas
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10.1063/1.3371697
/content/aip/journal/jap/107/10/10.1063/1.3371697
http://aip.metastore.ingenta.com/content/aip/journal/jap/107/10/10.1063/1.3371697
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Cross section of simplified pixel structure for an OLED device.

Image of FIG. 2.
FIG. 2.

Sketch of the experimental set-up.

Image of FIG. 3.
FIG. 3.

Typical voltage and current waveforms during an rf circle for (a) and (b) discharges. The fundamental frequency component of every waveform is as well extracted.

Image of FIG. 4.
FIG. 4.

Patterned sample treated by (120 s) and (60 s) sequential plasmas. Typical image of water drops equilibrated on the ITO and ZPN regions.

Image of FIG. 5.
FIG. 5.

Treatment by plasma. Water CA on every region (a) and XPS elemental composition on ITO (b), and ZPN (c) vs treatment time.

Image of FIG. 6.
FIG. 6.

Treatment by plasma. Water CA on every region (a) and XPS elemental composition on ITO (b), and ZPN (c) vs treatment time.

Image of FIG. 7.
FIG. 7.

Patterned (“region”) and unpatterned (“substrate”) samples treated by plasma. Water CA on ITO (a) and ZPN (b) vs treatment time.

Image of FIG. 8.
FIG. 8.

Treatment by and sequential plasmas. Water CA on every region (a) and XPS elemental composition on ITO (b), and ZPN (c) vs treatment time.

Image of FIG. 9.
FIG. 9.

Typical AFM topography images of pristine sample (a) ITO and (c) ZPN and sample treated by (300 s) and (60 s) sequential plasmas (b) ITO and (d) ZPN. Scan width 1.0 micron.

Image of FIG. 10.
FIG. 10.

Sixteen samples treated at all the conditions of Figs. 5, 6, and 8. For each sample, the mean rms roughness value (solid circles) of ZPN and ITO regions was calculated from the available scans (open circles). The amount of scatter in the rms values can be seen from the open circles that show results from individual scans. (a) rms roughness on both regions versus the resulting index of order after sorting the rms values of ZPN images and (b) treatment time for each sample used in the above figure. Samples grouped in the same row were prepared on the same date.

Image of FIG. 11.
FIG. 11.

Ion mass spectra for (a) and (b) discharges, at the conditions applied for the substrate treatment. The spectrometer probe was coplanar with the anode electrode.

Image of FIG. 12.
FIG. 12.

Absolute ion flux vs the peak-to-peak rf voltage for (a) and (b) discharges. The ion flux probe was coplanar with the anode electrode. The samples were treated at the power of about 1 W.

Image of FIG. 13.
FIG. 13.

UV-visible optical emission spectra for (a) and (b) discharges, at the conditions applied for the substrate treatment. The light was collected at 1 cm in front of the anode electrode through the electrode itself.

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/content/aip/journal/jap/107/10/10.1063/1.3371697
2010-05-27
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Highly-selective wettability on organic light-emitting-diodes patterns by sequential low-power plasmas
http://aip.metastore.ingenta.com/content/aip/journal/jap/107/10/10.1063/1.3371697
10.1063/1.3371697
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