(a) Scanning ion microscope image of the FIB-modified S/B optical fiber probe. The scale bar indicates . (b) An optical image of the designed S/B-probe holder. (c) Illustration of SNOM-KFM measurements.
Images observed with S/B fiber probes. (a) Topographic and (b) KFM potential images of an as-deposited thin film, and (c) KFM potential image of the SP pattern of periodic dots ( repetition). Scan sizes are 2.0, 20, and , respectively.
Transfer functions obtained with the S/B fiber probes. The configuration of probe direction against the potential step is illustrated in the inset (longitudinal perpendicular to the step, parallel to the step). Lines show multi-Gaussian fittings.
SP reduction patterns (inverted KFM images) on an thin film resulting from the spot photoexcitation (409 nm) from the S/B fiber probes at (a) 50 and (b) 3200 s with an ideal coating around the apex, and (c) 0.5 and (d) 50 s with an imperfect coating near the apex. KFM images were inverted to show a dip as a peak. The image sizes are [(a) and (b)] and [(c) and (d)]. The photoexcitation power through the aperture was estimated to be approximately 1.0 nW [(a) and (b)] and 30 nW [(c) and (d)].
SP reduction pattern (inverted KFM image) obtained by photoexcitation (409 nm, 1.0 nW) with the S/B probe scan. The traces (one spot and two lines) were formed one at a time by a spot photoexcitation (32 min) and two line-scan photoexcitation: line scan with repetition 0.5 Hz for 45 min (line scan A) and line scan with repetition 0.5 Hz for 30 min (line scan B). The image size is .
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