(a) The XRD patterns of 11-layer PZT/CFO epitaxial multilayers, the inset gives the scan results and (b) the XRD scan of PZT, CFO, and PZT/CFO composite films with different number of layer.
[(a) and (b)] The low-magnification TEM images of 11-layer and 3-layer PZT/CFO nanocomposite films, (c) the HRTEM image of interfacial structure of PZT/CFO, and (d) the SAED pattern including PZT, CFO, and STO substrate.
Experimental observation and theoretical prediction of spectroscopic dielectric constant (a) and dielectric loss (b) of PZT, CFO, and PZT/CFO multilayer thin films.
Ferroelectric hysteresis loops of the PZT film and the PZT/CFO multilayered composite films.
Electric field dependent-leakage current density curves of the PZT/CFO multilayered composite films, where the inset denote the leakage current density curves of the single layer PZT and CFO films.
Theoretical calculation of in-plane stress-dependent polarization in pure PZT film, PZT/CFO multilayers, simulated results of polarization considering size effect in each PZT layer, and our experimental fitting in PZT single-phase film and 3-layer, 5-layer, and 11-layer PZT/CFO nanocomposite thin films.
(a) Magnetization hysteresis loops of single-phase CFO (the inset) and PZT/CFO multilayered thin films grown on STO substrates and (b) magnetization hysteresis loops of expitaxial CFO thin films grown on STO and MgO substrates (the inset shows the corresponding XRD patterns where the lattice constant in each sample can be derived).
In-plane strain dependent magnetic behaviors in CFO and CFO/PZT multilayers grown on STO substrate and CFO grown on MgO substrate.
The in-plane and out-of-plane lattice constant of PZT and the PZT/CFO multilayers.
The values of parameters used in calculating the polarization of PZT and PZT/CFO multilayers.
In-plane and out-of-plane lattice constants, saturated magnetization, and coercive field of the CFO films and multilayers.
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