Postannealing temperature dependence of the relative dielectric constant and loss tangent for the PMNT pyrochlore thin films, measured at room temperature and at a frequency of 100 kHz.
Temperature dependence, measured at 10, 40, and 100 kHz, respectively, of the dielectric constant and loss tangent over 77 to 400 K for the highest-permittivity PMNT thin film annealed at .
(a) Dielectric constant of the annealed PMNT pyrochlore thin film as a function of applied dc bias field, measured at 300 K and 100 kHz. (b) Dielectric tunability as a function of the applied dc bias field.
Linear fits of vs for the annealed PMNT pyrochlore thin film.
curve for the annealed PMNT pyrochlore film. The top left inset shows the variation in leakage current density with the applied dc electric field up to 1 MV/cm. The information about the breakdown electric field is presented in the bottom right inset.
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