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Submicron YBaCuO biepitaxial Josephson junctions: -wave effects and phase dynamics
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View: Figures


Image of FIG. 1.
FIG. 1.

SEM image of a wide junction. In the inset a sketch of the junctions’ structure is shown.

Image of FIG. 2.
FIG. 2.

characteristic of wide junctions with various misorientation angles: (a) , (b) , and (c) . All the ’s were measured with no applied magnetic field and at , except (b), which was measured at . Panel (d) shows the linear relation between the switching voltage and the product of representative junctions.

Image of FIG. 3.
FIG. 3.

product and values normalized to the maximum value (inset) of submicron junctions as a function of the misorientation angles. The comparison with results on junctions a few microns wide (dashed line in the inset) (Ref. 9) gives a quantitative information on a closer correspondence with the ideal Sigrist–Rice formula for off-axis biepitaxial junctions (solid line).

Image of FIG. 4.
FIG. 4.

Three-dimensional plot of an experimental pattern of a junction measured at . The superimposed black line is the Fraunhofer pattern.

Image of FIG. 5.
FIG. 5.

characteristic of a wide junction with a misalignment angle , measured at and (black dots). This was recorded with various amplitudes of the current sweep to visualize the intermediate states between 0 and 1 mV and obtain a better resolution of the steps. A simulation made using a two facet configuration, and is also shown (hollow grey dots, red online). For this simulation, the current is normalized to the critical current and the voltage to


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Submicron YBaCuO biepitaxial Josephson junctions: d-wave effects and phase dynamics