XRR profiles (open circles) and respective fits (solid lines) for /CoO/Fe films deposited on an oxidized Si substrate where represents the respective Ag film thickness. From upper to lower curve: no Ag layer, , 96, 144, 151, and 403 Å Ag layer. The curves have been shifted vertically for clarity.
Surface topography of Fe films recorded with in situ STM for a scan area of for (a) CoO/Fe and (b) Ag(151 Å)/CoO/Fe. The average grain size in (a) is 150 Å and 500 Å in (b). Graph (c) shows the evolution of the rms roughness as a function of scanning length derived from the STM measurements.
(a)–(d) Initial (solid line) and trained (dashed line) VSM hysteresis loops recorded consecutively after field cooling in 0.4 T to 10 K. (a) CoO/Fe and (b)–(d) /CoO/Fe samples with , 96 and 144 Å, respectively.
Evolution of (triangles) and (squares) as well as (dots) with the Ag film roughness (and thickness) as determined from magnetization measurements after field cooling in 0.4 T to 10 K for /CoO/Fe films. The open symbols refer to a CoO/Fe sample without a Ag buffer layer. The dashed lines are a guide for the eye.
(a)–(d) AMR of the initial (solid line) and trained (dashed line) loop recorded consecutively after field cooling in 0.4 T to 10 K. (a) shows a CoO/Fe and (b)–(d) /CoO/Fe samples with , 96, and 144 Å, respectively. The data were taken with the current in plane and perpendicular to the in-plane magnetic field.
Temperature dependence of (upper graph) as well as and (lower graph) deduced from the initial hysteresis loops recorded with VSM after field cooling in 0.4 T to 10 K. The squares correspond to the CoO/Fe sample. The triangles/dots represent /CoO/Fe samples with and 144 Å, respectively.
Change in anisotropic magnetoresistance with time for a Ag(21 Å)/CoO/Fe sample field cooled in 0.4 T to 10 K. The external field was fixed near of the initial and trained loop; and of the initial loop.
Relevant structural and magnetic properties for all samples (S1–S6) investigated.
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