Electronic and nuclear energy losses with penetration depth of 1.2 MeV Ar ions in ZnO as calculated from SRIM.
Variation in ionization, and with ion range as calculated from SRIM.
Color of ZnO samples, (a) unirradiated and irradiated with fluence, (b) , (c) , and (d) .
SEM of (a) unirradiated and (b) irradiated (fluence ) ZnO.
Variation in room temperature resistivity with irradiation fluence.
Enlarged view of the (101) XRD peak region of the ZnO samples. Inset: similar view of the (002) peak of the same XRD spectra.
Variation in FWHM of (101) XRD peak (black square), R of intensity (101) to (002) peak (blue down triangle), and (101) peak position (red circle) with irradiation fluence.
PL spectra of ZnO sample unirradiated and irradiated with fluence , and . Inset: variation in PL intensity ratio of peak at 3.27 eV to peak at 2.43 eV with irradiation fluence.
Variation in PL intensity at 2.43 eV with (002) XRD peak position.
Article metrics loading...
Full text loading...