Resistivity of films at 300 K as functions of (a) W content , which is a nominal value, and (b) substrate temperature .
(a) Typical XRD pattern of anatase thin film deposited on LSAT. The inset shows the XRD pattern. (b) Lengths of the -axis (triangles) and -axis (circles) of the anatase structure as functions of W content .
(a) Resistivity , (b) carrier concentration , and (c) Hall mobility of and as functions of temperature. Solid and dashed curves denote the transport properties of and , respectively.
Ti and W core-level spectra of the film obtained with a photon energy of 1486.6 eV (monochromatic x ray). Circles indicate experimental data, solid curves (orange, blue, and red lines) represent the components of Ti , , and , respectively, obtained by least square fitting. The dashed curve (green line) is the background, and the dotted curve (gray line) represents the total fitting result.
X-ray photoemission spectra of the films. Inset: Ti on- and off-resonant photoemission spectra obtained with photon energies of and 600 eV, respectively.
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