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Direct measurement of graphene adhesion on silicon surface by intercalation of nanoparticles
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10.1063/1.3294960
/content/aip/journal/jap/107/2/10.1063/1.3294960
http://aip.metastore.ingenta.com/content/aip/journal/jap/107/2/10.1063/1.3294960
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Figures

Image of FIG. 1.
FIG. 1.

SEM showing a typical graphene-silicon sample with a distribution of blisters wedged open by gold nanoparticles. (a) A number of distinct geometries are observed (scale ): (A) circular blister wedged open by a single particle; (B) irregular blister as a result of adjacent blisters interacting with one another; (C) elongated blister as two particles are trapped at the crystallographic ledge (note the thin layer on the right contrasting the thick multilayer on the left that appears more opaque); (D) trapezoidal blister wedged open by a particle cluster is interacting with a longitudinal buckle. (b) The trapezoidal blister (D) with the four wedging nanoparticles is magnified (scale ).

Image of FIG. 2.
FIG. 2.

A typical circular blister trapping two nanoparticles at the interface. (a) A SEM image. The contrast is inverted to highlight the blister periphery so the two trapped particles appear dark (scale ). (b) A 3D representation. (c) Sketch of blister for theoretical modeling.

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/content/aip/journal/jap/107/2/10.1063/1.3294960
2010-01-29
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Direct measurement of graphene adhesion on silicon surface by intercalation of nanoparticles
http://aip.metastore.ingenta.com/content/aip/journal/jap/107/2/10.1063/1.3294960
10.1063/1.3294960
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