Optical constants for and Fe near the boron K-absorption edge. The continuous line is for and dashed line is for Fe using Henke et al. (Ref. 1). Solid circles represent measured values of .
Hard XRR spectrum of (60 nm)-on-Fe (18 nm) bilayer film at 8047 eV. In the inset, the continuous line shows EDP profile of the bilayer and the dotted line shows bulk values.
Simulated reflectivity profile at 187.5 eV for 60 nm thin film with a low-density layer of 1.3 nm (a) depth sensitivity with porosity 35%. (b) sensitivity to porosity.
Soft XRR profiles of -on-Fe bilayer film near boron K-absorption edge. Solid circles represents experimental data continuous line represents the fitted value. The right side inset shows high sensitivity to interface at 187.5 eV. The left side inset shows the model.
In-depth variation of dispersion part of refractive index obtained after fitting of the measured soft XRR profile of Fig. 4. The inset shows the and substrate/Fe interface.
Soft XRR measurements of -on-Fe bilayer film.
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