Full profile Rietveld refinement of diffraction pattern for nanocrystalline . Asterisks, upper, and lower solid lines represent experimental, calculated, and difference pattern, respectively. Bars are marked at the positions of diffraction peaks.
Transmission electron microscopic patterns of nanocrystalline : (a) low magnification image and (b) HRTEM image.
Selected angle-dispersive synchrotron XRD patterns: (a) compression up to 64.9 GPa and (b) subsequent decompression. The appearance of the (113) peak for is arrowed.
The evolution of wight percent for and with pressure during compression.
Full profile Rietveld refinements of diffraction patterns for : (a) at 64.9 GPa and (b) ambient pressure. Asterisks, upper, and lower solid lines represent experimental, calculated, and difference pattern, respectively. Bars are marked at the positions of diffraction peaks.
The optical transmission spectrum of 14 nm at ambient condition.
Pressure evolution of lattice parameters: (a) of the , and (b) of the . Solid and open symbols refer to the compression and decompression data, respectively. The differential (in angstrom) of the vertical scales of each graph is the same, in order to facilitate comparison between the evolutions of lattice parameters. Dot lines are drawn as a guide for the eyes.
The evolution of for and with pressure. Solid lines and dashed lines are the Birch–Murnaghan equation of state fits to experimental data with unfixed , and with fixed , respectively.
Comparison of bulk modulus and unit-cell volume of and at ambient conditions, and onset pressure of ,to transition in our study with those reported.
Comparison of linear compressibilities of and in our study with data reported.
Article metrics loading...
Full text loading...