AFM images of (a) as-deposited and (b) .
characteristics determined for as-deposited (open circles), (open triangles), and (solid squares) with Au contacts.
Surface charge profile and dielectric dispersions of films obtained by measurements. (triangles) and (squares) with Au contacts.
XPS of (a) Sn and (b) O from a film (; the surface-sensitive angle). Solid lines and open circles show spectra and sum-fitted curves, respectively. Dashed lines are fitted curves for each bond: , , , O–OH, and .
(a) Measurement angle dependence of XPS intensity ratios of and . Circles, triangles, and squares refer to as-deposited, , and , respectively. (b) Schematic illustrations of plasma treated film surface structures.
Measurement angle dependence of the chemical state of the Sn core level. Circles, triangles, and squares refer to as-deposited, , and , respectively.s
Valence band photoemission spectra for (a) as-deposited, (b) , and (c) .
Plasma treatment time dependence of VBMs (solid squares) and (open squares) of films.
Schematic energy level diagrams for an (a) ideal interface prior to contacting, (b) Au contact on an as-deposited film, and (c) Au contact on a plasma treated film. : Fermi level of metal (Au), : Fermi level of , : conduction band, : valence band, : band gap, : metal work function of Au, : electron affinity of , Sn : core level for Sn , and : SBH of the Au contact to the plasma treated films (0.58–0.60 eV).
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