1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Improved near-field scanning microwave microscope combined with electrical transport measurement for characterizing nonuniformity of electrical dissipation in films of variable thickness
Rent:
Rent this article for
USD
10.1063/1.3259372
/content/aip/journal/jap/107/4/10.1063/1.3259372
http://aip.metastore.ingenta.com/content/aip/journal/jap/107/4/10.1063/1.3259372

Figures

Image of FIG. 1.
FIG. 1.

Experimental setup for a combined NSMM and transport measurement system.

Image of FIG. 2.
FIG. 2.

[(a) and (c)] 2D maps of on YBCO samples Y1 and Y2 with a manually scratched defect and lithographically fabricated COD, respectively. The dashed rectangle depicts actual location of defect while the dashed horizontal line shows the approximate location of line scan of microwave reflected power in (b) and (d). Illustrations of what the cross section of each defect may possibly look like are shown as insets.

Image of FIG. 3.
FIG. 3.

(a) Induced voltage as function of the input microwave power on Y3 and Y4 using probe tip T1. (b) Curves normalized to bias current density.

Image of FIG. 4.
FIG. 4.

Comparison of microwave images and line scans using, respectively, NSMM probe tips T5 and T4. (a) SEM image of a Cu tip (T5) and the corresponding (b) 2D and (c) 1D reflected microwave power scans of a TEM grid showing a step resolution of . (d) SEM image of an W tip (T4) and the corresponding (e) 2D and (f) 1D reflected microwave power scans of the same TEM grid. Submicron step resolution of was achieved.

Image of FIG. 5.
FIG. 5.

Comparison of the induced voltage normalized to bias current density using probe tip T5 tuned to the fundamental resonant frequency and probe tip T4 tuned to the second harmonic frequency on samples (a) Y3 and (b) Y4, respectively.

Tables

Generic image for table
Table I.

Summary of the metallic NSMM tips used in this experiment.

Loading

Article metrics loading...

/content/aip/journal/jap/107/4/10.1063/1.3259372
2010-02-19
2014-04-23
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Improved near-field scanning microwave microscope combined with electrical transport measurement for characterizing nonuniformity of electrical dissipation in YBa2Cu3O7−δ films of variable thickness
http://aip.metastore.ingenta.com/content/aip/journal/jap/107/4/10.1063/1.3259372
10.1063/1.3259372
SEARCH_EXPAND_ITEM