XRD scan profiles of iron oxide films deposited on (a) Si and (b) MgO substrates. The annealing temperatures are indicated. The triangles indicate the diffraction peaks of the substrates.
XRD scans for the -annealed film on MgO. The peaks are the (115) reflections of the iron oxide spinel structure and the (224) reflections of MgO.
Magnetization curves of the films deposited on MgO and Si substrates measured at 300 K. Both films were annealed at .
(a) Annealing temperature dependence of the magnetic properties of films deposited on MgO substrates. The inset shows the detailed magnetization curves around 0 T. (b) Magnetization curves of the -annealed film on a MgO substrate measured at 300 and 2 K. The inset shows the detailed magnetization curves around 0 T.
Temperature variation in the magnetic moment per Fe atom. The dotted line indicates the extrapolation to 0 K.
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