Three model structures under consideration in this paper. In (a), a SC occupying the half space, , is referred to as the structure I, while in (b), the structure II, is a superconducting film in the region, , and structure III depicted in (c) is a bilayer, where a SC film is deposited on a dielectric material (m) with thickness . The optical wave is launched obliquely on the plane boundary from the left free-space region.
Wavelength-dependent refractive index of YBCO at 7.7 K
Reflectance plotted as a function of wavelength at normal incidence and TE and TM waves at 15° for structure I.
Reflectance as a function of the wavelength for (a) TM wave and (b) TE wave, respectively, in normal incidence and at various incidence angles for structure I.
Reflectance vs wavelength at different angles of incidence for (a) TM wave, and (b) TE wave, respectively, for structure II. The thickness of YBCO is taken to be 220 nm.
Reflectance near threshold wavelength at different slab’s thicknesses for TM wave in structure II. The incident angel is fixed at 5°.
Reflectance vs wavelength at different angles of incidence for (a) TM wave and (b) TE wave, respectively, for structure III. The thicknesses of YBCO and MgO are taken to be and , respectively.
Reflectance near threshold wavelength at different film thicknesses of YBCO for (a) TM wave and (b) TE wave, respectively, for structure III. The incident angle is 5° and the thickness of MgO is .
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