1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Thermoelectric properties of electrically stressed Sb/Bi–Sb–Te multilayered films
Rent:
Rent this article for
USD
10.1063/1.3326878
/content/aip/journal/jap/107/6/10.1063/1.3326878
http://aip.metastore.ingenta.com/content/aip/journal/jap/107/6/10.1063/1.3326878

Figures

Image of FIG. 1.
FIG. 1.

(a) Seebeck coefficient and electrical resistivity and (b) carrier concentration and Hall mobility of the electrically stressed Bi–Sb–Te and Sb/Bi–Sb–Te films measured at room temperature as a function of annealing temperature.

Image of FIG. 2.
FIG. 2.

SEM images of the Bi–Sb–Te and Sb/Bi–Sb–Te films before and after electrically stressing at for 5 min, respectively. [(a) and (b)] As-deposited Bi–Sb–Te and Sb/Bi–Sb–Te and [(c) and (d)] electrically stressed Bi–Sb–Te and Sb/Bi–Sb–Te.

Image of FIG. 3.
FIG. 3.

Experimental and theoretical Seebeck coefficients of the thermally and electrically treated Bi–Sb–Te and Sb/Bi–Sb–Te films as a function of carrier concentration.

Tables

Generic image for table
Table I.

Seebeck coefficient, electrical resistivity, carrier concentration, Hall mobility, scattering parameter, and thermoelectric power factor of the original Bi–Sb–Te and the Sb-inserted Bi–Sb–Te films electrically stressed at for 5 min, respectively.

Loading

Article metrics loading...

/content/aip/journal/jap/107/6/10.1063/1.3326878
2010-03-29
2014-04-20
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Thermoelectric properties of electrically stressed Sb/Bi–Sb–Te multilayered films
http://aip.metastore.ingenta.com/content/aip/journal/jap/107/6/10.1063/1.3326878
10.1063/1.3326878
SEARCH_EXPAND_ITEM