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Effect of ultraviolet radiation on slow-relaxation processes in ferroelectric capacitance structures
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10.1063/1.3327236
/content/aip/journal/jap/107/8/10.1063/1.3327236
http://aip.metastore.ingenta.com/content/aip/journal/jap/107/8/10.1063/1.3327236
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Schematic presentation of the capacitance relaxation processes after end of the voltage pulse impact.

Image of FIG. 2.
FIG. 2.

Schematic diagram of the FE varactors: (a) two electrodes structure and (b) four electrodes structure.

Image of FIG. 3.
FIG. 3.

Secondary ion-mass spectrometry of the investigated BSTO films in structure

Image of FIG. 4.
FIG. 4.

Typical dependence of BSTO thin films and its absorption coefficient as a function of UV wavelength (in the inset).

Image of FIG. 5.
FIG. 5.

(a) Varactors capacitance relaxation and (b) their I-V characteristics in the dark regime and under UV irradiation with various wavelengths.

Image of FIG. 6.
FIG. 6.

(a) Correlation between the spectral dependences of the varactors’ capacitance relaxation times and (b) measured leakage currents.

Image of FIG. 7.
FIG. 7.

Correlation between experimental spectral dependence of the capacitance relaxation times (●) and leakage current under voltage (○) for a four electrode varactor structures with thicknesses of the BSTO films: (a) , (b) , and (c) . Dashed lines—theoretical estimation of spectral photocurrent dependencies in accordance with Eq. (5) in arbitrary units corresponding to the I axis.

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/content/aip/journal/jap/107/8/10.1063/1.3327236
2010-04-20
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Effect of ultraviolet radiation on slow-relaxation processes in ferroelectric capacitance structures
http://aip.metastore.ingenta.com/content/aip/journal/jap/107/8/10.1063/1.3327236
10.1063/1.3327236
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