Schematic presentation of the capacitance relaxation processes after end of the voltage pulse impact.
Schematic diagram of the FE varactors: (a) two electrodes structure and (b) four electrodes structure.
Secondary ion-mass spectrometry of the investigated BSTO films in structure
Typical dependence of BSTO thin films and its absorption coefficient as a function of UV wavelength (in the inset).
(a) Varactors capacitance relaxation and (b) their I-V characteristics in the dark regime and under UV irradiation with various wavelengths.
(a) Correlation between the spectral dependences of the varactors’ capacitance relaxation times and (b) measured leakage currents.
Correlation between experimental spectral dependence of the capacitance relaxation times (●) and leakage current under voltage (○) for a four electrode varactor structures with thicknesses of the BSTO films: (a) , (b) , and (c) . Dashed lines—theoretical estimation of spectral photocurrent dependencies in accordance with Eq. (5) in arbitrary units corresponding to the I axis.
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