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Measuring the effects of low energy ion milling on the magnetization of Co/Pd multilayers using scanning electron microscopy with polarization analysis
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10.1063/1.3358218
/content/aip/journal/jap/107/9/10.1063/1.3358218
http://aip.metastore.ingenta.com/content/aip/journal/jap/107/9/10.1063/1.3358218
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Figures

Image of FIG. 1.
FIG. 1.

SEMPA measurements of a Co/Pd multilayer surface display (a) the surface topography, (b) the out-of-plane surface magnetization, and [(c) and (d)] the in-plane surface magnetization. This image was recorded after 52 nm of material (including capping layer) was removed.

Image of FIG. 2.
FIG. 2.

Images of (a) the in-plane and (b) out-of-plane magnetization angle are calculated from magnetization component images (Fig. 1). (c) A histogram of image (b) shows the fraction of image pixels with a particular magnetization angle in the x-z plane and indicates that the magnetic domains point mostly out of plane.

Image of FIG. 3.
FIG. 3.

Magnetization angle distribution as a function of mill depth using 50 eV (top plot), 1 keV (middle), and 2 keV Ar ions (bottom plot). A schematic of the multilayer is shown at the very top to guide the eyes. These contour plots are composed of histograms of the magnetic polarization angle in the x-z plane recorded during ion milling [the histogram in Fig. 2(c) is indicated by a white dotted line in the top plot]. Ion milling with 50 eV ions does not change the initial out-of-plane magnetization distribution, as indicated by the two red horizontal stripes at 90° and 270°, while milling with higher energy ions increases the width of the angular distribution as the magnetization tilts more in-plane. At all milling energies, the magnetization is seen to lay down completely in-plane after most of the bilayers have been removed (right side of plots).

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/content/aip/journal/jap/107/9/10.1063/1.3358218
2010-04-30
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Measuring the effects of low energy ion milling on the magnetization of Co/Pd multilayers using scanning electron microscopy with polarization analysis
http://aip.metastore.ingenta.com/content/aip/journal/jap/107/9/10.1063/1.3358218
10.1063/1.3358218
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