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Analyzing real-time surface modification of operating semiconductor laser diodes using cross-sectional scanning tunneling microscopy
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10.1063/1.3380826
/content/aip/journal/jap/107/9/10.1063/1.3380826
http://aip.metastore.ingenta.com/content/aip/journal/jap/107/9/10.1063/1.3380826
/content/aip/journal/jap/107/9/10.1063/1.3380826
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/content/aip/journal/jap/107/9/10.1063/1.3380826
2010-05-10
2014-08-22
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Analyzing real-time surface modification of operating semiconductor laser diodes using cross-sectional scanning tunneling microscopy
http://aip.metastore.ingenta.com/content/aip/journal/jap/107/9/10.1063/1.3380826
10.1063/1.3380826
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