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Large-scale statistical analysis of early failures in Cu electromigration, Part II: Scaling behavior and short-length effects
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10.1063/1.3374702
/content/aip/journal/jap/108/1/10.1063/1.3374702
http://aip.metastore.ingenta.com/content/aip/journal/jap/108/1/10.1063/1.3374702
/content/aip/journal/jap/108/1/10.1063/1.3374702
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/content/aip/journal/jap/108/1/10.1063/1.3374702
2010-07-13
2014-09-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Large-scale statistical analysis of early failures in Cu electromigration, Part II: Scaling behavior and short-length effects
http://aip.metastore.ingenta.com/content/aip/journal/jap/108/1/10.1063/1.3374702
10.1063/1.3374702
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