1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Intrinsic detection efficiency of superconducting nanowire single-photon detectors with different thicknesses
Rent:
Rent this article for
USD
10.1063/1.3437043
/content/aip/journal/jap/108/1/10.1063/1.3437043
http://aip.metastore.ingenta.com/content/aip/journal/jap/108/1/10.1063/1.3437043

Figures

Image of FIG. 1.
FIG. 1.

SEM image of the meander structure: the bright lines are reflections from the surface of the sapphire substrate. The gray area is the NbN film.

Image of FIG. 2.
FIG. 2.

Schematics of the experimental setup. Inset shows the typical voltage transient which appears at the input of the counter in response to a single photon.

Image of FIG. 3.
FIG. 3.

Computed ABS of the meander structures with different thicknesses for incident light polarized parallel (P-pol) and orthogonal (S-pol) with respect to the meander lines.

Image of FIG. 4.
FIG. 4.

Total count rate vs relative bias current at the wavelength 500 nm for the meander NbN412. At the count rate increases quickly due to contribution of the dark counts (dashed circle).

Image of FIG. 5.
FIG. 5.

Detection efficiency of the meander NbN344 at different bias currents at 6 K. Arrow marks the cutoff wavelength for . Solid lines show computed DE due to thermal excitation of magnetic vortices.

Image of FIG. 6.
FIG. 6.

Wavelength dependences of the DE normalized to its value at for the meanders with different thicknesses. The DE for all meanders was measured at and 6 K. The arrows mark the cutoff wavelengths. Solid lines represent DE due to vortex excitation.

Image of FIG. 7.
FIG. 7.

The experimental critical current (symbols) and the Bardeen’s depairing critical current (solid line) for the 4 nm thick meander.

Image of FIG. 8.
FIG. 8.

Intrinsic DE for the meanders with different thicknesses at the wavelengths 500 and 1500 nm. The IDE is plotted vs reciprocal square resistance. Solid line is the computed IDE for vortex assisted photon detection.

Tables

Generic image for table
Table I.

Parameters of the studied meanders: is the film thickness corresponding to the sputtering time, is the nominal width of the meander line, is the zero-resistance critical temperature of the meander, is the experimental critical current at 4.2 K, is the square resistance at 20 K, and is the wavelength corresponding to the model cutoff of the hot-spot detection mechanism. Meanders with equal thicknesses belong to different detector series.

Loading

Article metrics loading...

/content/aip/journal/jap/108/1/10.1063/1.3437043
2010-07-09
2014-04-20
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Intrinsic detection efficiency of superconducting nanowire single-photon detectors with different thicknesses
http://aip.metastore.ingenta.com/content/aip/journal/jap/108/1/10.1063/1.3437043
10.1063/1.3437043
SEARCH_EXPAND_ITEM