Hysteresis loops of as-deposited samples A and C at RT, the inset (a) and (b) show the hysteresis loops of sample A as-deposited measured at 50 K and annealed for 2 h measured at RT, respectively.
Temperature dependence of the zero-field-cooled and field-cooled magnetization for the three as-deposited samples in 100 Oe field.
The XRD patterns for sample A and sample C as-deposited and annealed.
XPS spectra (a) and Zn LMM Auger spectra (b) of sample A and sample C as-deposited.
The field dependence of MR ratios of as-deposited sample A at 10 K (a) and RT (b), respectively. The inset of Fig. 5(b) shows the dependence of the MR ratio on the Co concentration with the magnetic field up to 20 kOe at RT.
(a) Dependence of on for as-deposited sample A, the solid line represents the linear fit result with . (b) Temperature dependence of MR for as-deposited sample A from 10 to 300 K. The solid curve represents the theoretical MR given by Eq. (2) with , , and .
The properties of the Co/ZnO as-deposited films. Co concentration from EDS, blocking temperature from ZFC curves, volume of the magnetic regions determined from using , and determined from fit of MR curves using Eq. (1), and the region volume calculated from .
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