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Enhanced transmittance and fields of a thick metal sandwiched between two dielectric photonic crystals
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10.1063/1.3512903
/content/aip/journal/jap/108/10/10.1063/1.3512903
http://aip.metastore.ingenta.com/content/aip/journal/jap/108/10/10.1063/1.3512903
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) and (b) show the dispersion relation of the tunneling modes at the PC/Ag/PC interfaces for TE and TM waves, respectively. The thickness of Ag is 83.1 nm and the gray (white) regions are the pass (forbidden) bands of the PC above the air light line. Inset shows the tunneling modes at large angle of incidence. In PC denoted by , C is and D is . , , and . The refractive indices of Ag are referred from Ref. 21.

Image of FIG. 2.
FIG. 2.

(a) and (b) show numerical (the solid lines) and measured (the open circles) and of , respectively. The numerical (the dotted line) of a single silver film with the same thickness is also shown in (a). For the , numerical value of is 0.4440 (0.0002) at (589.14 nm), while measured value of is 0.380 at measured (598 nm) for normal incidence. The minimal numerical (measured) value of at 15° for TM waves is 0.0013 (0.029). All the other parameters are the same with those in Fig. 1

Image of FIG. 3.
FIG. 3.

Shows the simulated (solid lines) and (dashed lines) within at the wavelength of 589.14 nm. The thickness of Ag in the figure is four times of its real thickness. All the parameters are the same with those in Fig. 2.

Image of FIG. 4.
FIG. 4.

(a) Shows the simulated of a 1D PC with ten periods. The thickness of Ag layer is 8.31 nm (190.0 nm). The total thickness of Ag is the same as that of the Ag in Fig. 2. (b) shows the simulated in the structure at the short band-edge wavelength as indicated in (a).

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/content/aip/journal/jap/108/10/10.1063/1.3512903
2010-11-19
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Enhanced transmittance and fields of a thick metal sandwiched between two dielectric photonic crystals
http://aip.metastore.ingenta.com/content/aip/journal/jap/108/10/10.1063/1.3512903
10.1063/1.3512903
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