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Stress analysis and ferroelectric properties of thin film grown on different thickness of electrodes
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10.1063/1.3518516
/content/aip/journal/jap/108/11/10.1063/1.3518516
http://aip.metastore.ingenta.com/content/aip/journal/jap/108/11/10.1063/1.3518516
/content/aip/journal/jap/108/11/10.1063/1.3518516
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/content/aip/journal/jap/108/11/10.1063/1.3518516
2010-12-03
2014-08-22
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Stress analysis and ferroelectric properties of Pb(Zr0.52Ti0.48)0.96Nb0.04O3 thin film grown on different thickness of BaPbO3 electrodes
http://aip.metastore.ingenta.com/content/aip/journal/jap/108/11/10.1063/1.3518516
10.1063/1.3518516
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