(a) XRD diffraction patterns for the 20 nm thick films with Cu content ranging from 0 to 32, (b) Dependence of FWHM of rocking curves on .
Hysteresis loops for the 20 nm thick films with (a) and (b) , and 50 nm thick films with (c) and (d) .
Dependence of (a) in-plane as well as out-of-plane coercivities, and (b) saturation magnetization on Cu content for the 20 nm thick and 50 nm thick films.
(a) Plane-view TEM images, (b) SAD patterns, (c) cross-section microstructure for the and (d) film with 20 nm in thickness, and (e) two-dimensional quantitative distribution of Co and Cu obtained from element mapping in the square area marked in (c). The red color denotes Co region and green color denotes Cu regions .
Magnetic domain patterns for the films with (a) 20 nm and (b) 50 nm thick; magnetic domain patterns for the films with (c) 20 nm and (d) 50 nm thick, respectively.
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