Fourier transformed EXAFS spectra measured at 10 K at the indium K-edge (top) for crystalline (left) and amorphous (right) InSb layers and the corresponding fitting results (bottom).
Temperature dependence of MSRD for In–Sb bonds in crystallized and amorphous InSb layers.
Fitting results of XRR spectra for amorphous InSb layers.
A summary of the fitting results at 10 K.
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