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Correlation between local structure and refractive index of e-beam evaporated composite thin films
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10.1063/1.3465328
/content/aip/journal/jap/108/2/10.1063/1.3465328
http://aip.metastore.ingenta.com/content/aip/journal/jap/108/2/10.1063/1.3465328

Figures

Image of FIG. 1.
FIG. 1.

vs spectra of (a) pure and (b) a representative composite thin films with ratio of (70:30).

Image of FIG. 2.
FIG. 2.

vs spectra of a pure and composite thin films with ratio of (90:10), (80:20), (70:30), and (50:50).

Image of FIG. 3.
FIG. 3.

Experimental vs spectra with best-fit theoretical plots for (a) pure and (b) a representative composite thin films with ratio of (90:10).

Image of FIG. 4.
FIG. 4.

XRD pattern of (a) pure and (b) a representative composite thin films with ratio of (90:10).

Image of FIG. 5.
FIG. 5.

(a) Variation in refractive index with the silica percentage in the composite thin film. (b) Variation in Hf–O bond length with the silica percentage in the composite thin film. (c) Variation in Hf–Hf bond length with the silica percentage in the composite thin film.

Tables

Generic image for table
Table I.

Structural parameters bond length and coordination number corresponding to first (Hf–O) and second (Hf–Hf) coordination shells around hafnium atom in thin film samples of pure and composite as obtained from EXAFS data analysis.

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/content/aip/journal/jap/108/2/10.1063/1.3465328
2010-07-29
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Correlation between local structure and refractive index of e-beam evaporated (HfO2–SiO2) composite thin films
http://aip.metastore.ingenta.com/content/aip/journal/jap/108/2/10.1063/1.3465328
10.1063/1.3465328
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