1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Impact ionization fronts in semiconductors: Numerical evidence of superfast propagation due to nonlocalized preionization
Rent:
Rent this article for
USD
10.1063/1.3465302
/content/aip/journal/jap/108/3/10.1063/1.3465302
http://aip.metastore.ingenta.com/content/aip/journal/jap/108/3/10.1063/1.3465302
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Sketch of the reversely biased -structure operated in the external circuit.

Image of FIG. 2.
FIG. 2.

Voltage (upper panel) and current (lower panel) during the switching process for different voltage ramps , 1, and 5 kV/ns (curves 1, 2, and 3, respectively).

Image of FIG. 3.
FIG. 3.

The spatial profiles of the electrical field and electron and hole concentrations and in the -base at different times: (a) increase in the free carrier concentration due to the field-enhanced ionization of deep-level impurities and subsequent avalanche multiplication at times , 2.295, and 2.31 ns (curves 1, 2, and 3, respectively); (b) propagation of impact ionization fronts at , 2.325, 2.335, 2.345, and 2.355 ns (curves 1, 2, 3, 4, and 5, repectively). Numerical parameters as in Fig. 2 for .

Image of FIG. 4.
FIG. 4.

The spatial profile of electron concentrations in the propagating front at times , 2.325, and 2.335 ns (curves 1, 2, and 3, respectively) in logarithmic scale. Numerical parameters as in Fig. 3.

Loading

Article metrics loading...

/content/aip/journal/jap/108/3/10.1063/1.3465302
2010-08-03
2014-04-19
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Impact ionization fronts in semiconductors: Numerical evidence of superfast propagation due to nonlocalized preionization
http://aip.metastore.ingenta.com/content/aip/journal/jap/108/3/10.1063/1.3465302
10.1063/1.3465302
SEARCH_EXPAND_ITEM