Secondary electron SEM image of the PZT polished and etched surface. Grains and ferroelectric domains are clearly resolved.
The region selected for subsequent analysis: (a) SEM image with the EBSD scan area marked in red and (b) EBSD orientation map. The legend line shows the location of the orientation profile shown in Fig. 3.
Line-scan of the relative crystallographic orientations measured using EBSD across the legend line in Fig. 2(b).
PFM images of the area depicted in Fig. 2. (a) SEM image, (b) AFM topography, and (c) PFM amplitude.
Line scans of the piezoresponse for two adjacent regions A and B (a) line scan locations and (b) PFM amplitude along the line scan.
Values of the piezoresponse peaks from Fig. 5.
Vertical piezoresponse amplitude calculated from the EBSD map.
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