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Piezoresponse force microscopy investigations of Aurivillius phase thin films
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10.1063/1.3474959
/content/aip/journal/jap/108/4/10.1063/1.3474959
http://aip.metastore.ingenta.com/content/aip/journal/jap/108/4/10.1063/1.3474959
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Flow chart for the preparation of (a) and (b) sols.

Image of FIG. 2.
FIG. 2.

XRD patterns of (a) , (b) , (c) , and (d) thin films annealed at various temperatures.

Image of FIG. 3.
FIG. 3.

HRSEM images of (a) BTO annealed at , (b) BTFO annealed at , and (c) BTF2O annealed at .

Image of FIG. 4.
FIG. 4.

AFM images of (a) BTO annealed at (rms ), (b) BTFO annealed at (rms roughness ranged from 15.1 to 67.6 nm), (c) BTF2O annealed at (rms ), and (d) BTFMO annealed at (rms ).

Image of FIG. 5.
FIG. 5.

(a) Topography, (b) piezoresponse amplitude, and (c) piezoresponse phase images of BTO annealed at .

Image of FIG. 6.
FIG. 6.

(a) Topography, (b) piezoresponse amplitude, and (c) piezoresponse phase images of BTFO annealed at .

Image of FIG. 7.
FIG. 7.

(a) Topography, (b) piezoresponse amplitude, and (c) piezoresponse phase images of BTF2O annealed at .

Image of FIG. 8.
FIG. 8.

(a) Topography, (b) piezoresponse amplitude, and (c) piezoresponse phase images of BTFMO annealed at .

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/content/aip/journal/jap/108/4/10.1063/1.3474959
2010-08-31
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Piezoresponse force microscopy investigations of Aurivillius phase thin films
http://aip.metastore.ingenta.com/content/aip/journal/jap/108/4/10.1063/1.3474959
10.1063/1.3474959
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