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Analysis of the degradation induced by focused ion beam for the realization of piezoelectric nanostructures
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10.1063/1.3474963
/content/aip/journal/jap/108/4/10.1063/1.3474963
http://aip.metastore.ingenta.com/content/aip/journal/jap/108/4/10.1063/1.3474963
/content/aip/journal/jap/108/4/10.1063/1.3474963
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/content/aip/journal/jap/108/4/10.1063/1.3474963
2010-08-31
2014-11-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Analysis of the degradation induced by focused ion Ga3+ beam for the realization of piezoelectric nanostructures
http://aip.metastore.ingenta.com/content/aip/journal/jap/108/4/10.1063/1.3474963
10.1063/1.3474963
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